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SapphiroScope - Scientific Visual

SapphiroScope™

在硅片切割前检验晶棒缺陷

概述

SapphiroScope™是用于检测LED和半导体行业中广泛使用的晶棒的半自动扫描器。 SapphiroScope™提供材料缺陷的3D模型,便于操作者对材料进行排序,为高效处理方法提供材料优化。

提供的功能

SapphiroScope™通过从轴向扫描晶片的前期构型获得2D切片图像,经过图像重组生成3D模型。用户可以旋转3D模型,轴向进行芯体扫描,观察任何位置的截面。

 

SapphiroScope™是适合于2“,4”,6“或8”圆柱形或长方形材料。