新闻和近期活动

新闻

Scientific Visual announces Ti:sapphire inspection collaboration

25-Feb-2026 – Scientific Visual is pleased to announce a new collaboration focused on the inspection of titanium‑doped sapphire (Ti:sapphire), a laser crystal known for its demanding growth process. Scientific Visual’s sapphire scanners, already optimized for boules...

SiC Scanner Featured on the Cover of Compound Semiconductor Magazine

We are proud to announce that the SiC Puck Scanner, co-authored by PVA TePla and Scientific Visual, is featured on the cover of  Compound Semiconductor (Vol. 31, Issue VIII 2025) — one of the most respected publications in the semiconductor industry. The cover story,...

近期活动

April 20 – 22, 2026 – CS International – Brussels, Belgium

Join us at the 16th CS International conference from April 20–22, 2026, in Brussels, where Scientific Visual will attend and connect with industry leaders in crystal inspection and compound semiconductors. We will be available throughout the event to discuss how our...