新闻和近期活动

新闻

SiC Scanner Featured on the Cover of Compound Semiconductor Magazine

We are proud to announce that the SiC Puck Scanner, co-authored by PVA TePla and Scientific Visual, is featured on the cover of  Compound Semiconductor (Vol. 31, Issue VIII 2025) — one of the most respected publications in the semiconductor industry. The cover story,...

Scientific Visual participated to the European Researchers’ Night

In the frame of the Skłodowska-Curie Actions within the grant agreementNo 101033102 (GaNSpector), Scientific Visual participated to the 2022 European Researchers’ Night: https://marie-sklodowska-curie-actions.ec.europa.eu/event/2022-european-researchers-night The...

近期活动

December 11, 2025 – CARAC 2025 – EPN Campus, Grenoble

We’re sharing this workshop because its non-destructive X-ray/neutron and microscopy methods align with our readers’ interests in SiC defect mapping, early puck screening, and wafer-level reliability/yield. Link: workshops.ill.fr/event/544/    

February 11 – 13, 2026 – SEMICON Korea – COEX, Seoul, Korea

SEMICON Korea 2025, held from 19 to 21 February at COEX in Seoul, is one of the most relevant industry gatherings for advanced semiconductor manufacturing. The event brings together leaders in wafer materials, metrology, inspection, and process equipment— fields that...