新闻和近期活动

新闻

SiC Scanner Featured on the Cover of Compound Semiconductor Magazine

We are proud to announce that the SiC Puck Scanner, co-authored by PVA TePla and Scientific Visual, is featured on the cover of  Compound Semiconductor (Vol. 31, Issue VIII 2025) — one of the most respected publications in the semiconductor industry. The cover story,...

Scientific Visual participated to the European Researchers’ Night

In the frame of the Skłodowska-Curie Actions within the grant agreementNo 101033102 (GaNSpector), Scientific Visual participated to the 2022 European Researchers’ Night: https://marie-sklodowska-curie-actions.ec.europa.eu/event/2022-european-researchers-night The...

近期活动

December 11, 2025 – CARAC 2025 – EPN Campus, Grenoble

We’re sharing this workshop because its non-destructive X-ray/neutron and microscopy methods align with our readers’ interests in SiC defect mapping, early puck screening, and wafer-level reliability/yield. Link: workshops.ill.fr/event/544/