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Keynote: 350 kg Sapphire Inspection Facility Open Doors for Complete Defect Traceability across LED Manufacturing Process

by webmaster | Mar 24, 2021

Scientific Visual CEO Ivan Orlov  presented a keynote at CSTIC the largest and most comprehensive annual semiconductor technology conference in Asia organized by SEMICON China which took place in March, 2021 in Shanghai. The lecture entitled “350 kg Sapphire...
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