SapphiroScope™ automated workstation inspects and assesses the quality of raw ingots (cylinders or rectangular bricks) before processing into wafer substrates for LED or into optical components.

SapphiroScope™ provides a 3D view of internal material defects without the need for polishing or ‘opening a window’. It allows the operator to sort incoming material, optimise it for the most efficient processing method, and predict wafering yield.

• Automated mapping of bubbles, structures, and clouds prior to wafering
• Measurement and classification of defects, including XYZ position, size, morphology
• Good/bad wafers indication
• Analysis in polarised light to detect twins, lattice defects and LABs
• 3D model of defects to share with your customers and suppliers.

A 3D model visualises the defects in the sapphire cylinder or a pre-form. The user has the possibility to rotate the 3D model, scan through the core volume, zoom, visualise and measure separate defects, and indicate defective wafers.

This three-minute video demonstrates handling of a non-polished sapphire core: rotation, zoom, defect identification and wafering by an operator.

Click at the right bottom corner to open the video in full size.

Materials:

• Sapphire
• Ruby
• Transparent ceramics
• LTO, LTN
• Quartz
• Laser crystals
• Borosilicate glass

Dimensions:

• Cylinder ingots and rectangular bricks
• 2”, 4”, 6”, 8” or customized

• Automated quality inspection improves the yield of useable material
• Early defect detection ensures only the best material enters the costly processing chain
• Fast and objective feedback to the production team
• Measure the influence of growth parameters on production quality
• Objective, standardized and repeatable grading of your products improves customer relations.

To request an offer, please contact our sales by phone or by email:

• +41 79 217 12 10
• sales@scientificvisual.ch