3D viewer for crystals scans created by Scientific Visual scanners. You can explore a crystal, its defects and various options for coring/wafering taking these defects into account. It allows estimating the yield of different coring solutions and quality of corresponding end products.

Yield does not require connection to a scanner. You could view scans coming from your partners or a production team on any PC.

Who benefits?

• Companies growing, processing and trading industrial crystals
• Everyone who needs to monitor the quality of crystal manufacturing with micrometre precision

Free and Pro Versions

Yield Demo is free read-only software. It has one of the coring parameters locked to a specific value(s).
We recommend you install it first to get familiar with the Yield functionality. It will be available on this page in Q1 2021.

Submit your email below to receive download link when Yield Demo is released.

Yield Pro is a commercial full-featured version with the advanced coring optimisation algorithm.
Write to us at sales@scientificvisual.ch for acquiring a license.

Key Features

• 3D Model visualisation (SVCM files)
• 2D Scanner data visualisation (if raw SVCI scanner files are available)
• Defect clustering with statistics
• Defect grading
• Simple 3D Model edition and highlighting
• Coring & Wafering planning with user-defined parameters (limited in Demo version)
• (Pro) Advanced yield computation
• (Pro) Advanced metrics computation
• (Pro) Additional Scanning metadata
• (Pro) Generation of Certified model (coming in next release)

Documentation

• Introductory video (below)
• User Guide (available soon)

Submit your email to request download link for Yield Demo.