Taking guesswork out of crystal production
Scientific Visual offers quality control scanners that visualise volume defects, such as bubbles, cracks and cloudiness, in raw crystals.
They identify imperfections in pre- and post- polished sapphire, ruby, glass, fluorites, SiC and multitude of semiconductor crystals.
Our scanners ensure that only the best quality material enters the costly processing stream. The quality grades are adaptable to customers’ needs.
Scientific Visual services three key markets: watch, semiconductor and smartphone manufacturers.
|Download the brochure ”SapphiroScan™ for the watch industry”|
What if you could see internal flaws in sapphire crystal before processing it?
This movie recorded with CarrotScan™ shows defects in a raw sapphire crystal grown by Verneuil method. Scene switches from Skin visualization to Inside view of defects. Colour stands for sapphire defect density: from deep blue (non-defective material) to deep red (highest defectiveness).
Currently checking for defects in sapphire watch covers and wafers is done after full processing and polishing has been completed.
Today 15-20% of sapphire covers and wafers are rejected after being processed and polished to transparency due to internal flaws that were initially there.
Think about it.
It means that a typical sapphire factory wastes at least 1 day per week polishing discards!
Our SapphiroScan™ control system detects flaws in non-processed watch covers so that only high-quality items could enter the value chain. Providing ROI in 6-18 months, the scanner not only improves quality and reduces production costs, but also accumulates defect statistics for the growth process optimisation.
For Kyropolous and HEM crystal growers SapphiroScope™ automated station offers a fast, highly cost-effective alternative to manual quality control.
Unlike human inspection, all Scientific Visual scanners can be calibrated to perform objectively at a customer standards so ensuring quick, accurate diagnostic feedback during and after production.