News
SiC Scanner Featured on the Cover of Compound Semiconductor Magazine
We are proud to announce that the SiC Puck Scanner, co-authored by PVA TePla and Scientific Visual, is featured on the cover of Compound Semiconductor (Vol. 31, Issue VIII 2025) — one of the most respected publications in the semiconductor industry. The cover story,...
ICSCRM Highlight : Scientific Visual to unveil new inspection solution
Scientific Visual is pleased to announce that Frédéric Falise, Director and COO of the company, will speak at the upcoming International Conference on Silicon Carbide and Related Materials (ICSCRM 2025) in Busan. Mr. Falise will deliver an Industrial Talk on 15...
Frédéric Falise, Director at Scientific Visual to Speak at CS International 2025
We are excited to announce that Frédéric Falise, Executive Director at Scientific Visual, will be speaking at the CS International Conference 2025 in Brussels (7 - 9 April 2025). You can view the full agenda and additional details at...
Scientific Visual joins forces with PVA TePla
We are pleased to announce Scientific Visual strategic partnership with PVA TePla, a globally operating high-tech holding with expertise in semiconductors, crystal furnaces, and material inspection. This collaboration will further advance our capabilities in crystal...
Shenzhen-Bern Advanced Manufacturing and Cooperation Exchange Conference
Scientific Visual COO Mr. Frédéric Falise participated in the Shenzhen - Bern Advanced Manufacturing and Cooperation Exchange Conference organized by the China Embassy in Switzerland on 14 February 2023. Scientific Visual works to digitalise quality...
Upcoming Events
November 18 – 21, 2025 – SEMICON Europa 2025 – Messe München, Germany
We are pleased to announce that PVA TePla and Scientific Visual will participate in SEMICON Europa 2025, taking place from November 18–21 at Messe München in Munich, Germany. The event is the leading platform for the European semiconductor industry, attracting key...
December 11, 2025 – CARAC 2025 – EPN Campus, Grenoble
We’re sharing this workshop because its non-destructive X-ray/neutron and microscopy methods align with our readers’ interests in SiC defect mapping, early puck screening, and wafer-level reliability/yield. Link: workshops.ill.fr/event/544/
December 17 – 19, 2025 – SEMICON Japan – Tokyo Big Sight, Japan
We are pleased to highlight our partner PVA TePla, who will be exhibiting at SEMICON Japan 2025, taking place from December 17–19 at Tokyo Big Sight. SEMICON Japan is one of the most important events in Asia for the semiconductor and electronics manufacturing...