Scientific Visual
  • About us
    • Who we are
    • Team
    • News
    • Careers
    • Media Library
    • Privacy Policy
  • Crystal Scanners
    • SIC Puck Scanner
    • Divider
    • SapphiroScan
    • ↳ ROI Calculator
    • SapphiroScope
    • TotalScan
    • Divider
    • Quality Control Service
    • Process Optimisation
    • Consumables
  • YieldPro™ Software
    • YieldPro for SAM
    • YieldPro for Optical Tomography
  • Industries & Applications
    • Assisted AI Metrology
    • Semiconductors
      • Silicon Carbide
      • Sapphire Substrate
      • Gallium Nitride
    • Optics
      • Sapphire
      • Other Crystals and Glasses
    • Watch Industry
    • Custom Development
  • Defect Library
  • FAQs
  • Contact
  • English
  • Privacy Policy
  • Home
Select Page

SiC Scanner Featured on the Cover of Compound Semiconductor Magazine

by Abeti Ilofo | Nov 6, 2025

We are proud to announce that the SiC Puck Scanner, co-authored by PVA TePla and Scientific Visual, is featured on the cover of  Compound Semiconductor (Vol. 31, Issue VIII 2025) — one of the most respected publications in the semiconductor industry. The cover story,...

ICSCRM Highlight : Scientific Visual to unveil new inspection solution

by Abeti Ilofo | Sep 10, 2025

Scientific Visual is pleased to announce that Frédéric Falise, Director and COO of the company, will speak at the upcoming International Conference on Silicon Carbide and Related Materials (ICSCRM 2025) in Busan. Mr. Falise will deliver an Industrial Talk on 15...

Frédéric Falise, Director at Scientific Visual to Speak at CS International 2025

by Abeti Ilofo | Mar 5, 2025

We are excited to announce that Frédéric Falise, Executive Director at Scientific Visual, will be speaking at the CS International Conference 2025 in Brussels (7th – 9th April 2025). This year’s presentation will focus on “PVA Tepla...

February 11 – 13, 2026 – SEMICON Korea – COEX, Seoul, Korea

by Abeti Ilofo | Feb 14, 2025

SEMICON Korea 2025, held from 19 to 21 February at COEX in Seoul, is one of the most relevant industry gatherings for advanced semiconductor manufacturing. The event brings together leaders in wafer materials, metrology, inspection, and process equipment— fields that...

February 15 – 19, 2026 – International Solid-State Circuits Conference – San Francisco Marriott Marquis, CA, USA

by Abeti Ilofo | Feb 14, 2025

    The IEEE International Solid-State Circuits Conference (ISSCC) is one of the leading global forums for breakthrough work in integrated circuits (IC) and systems-on-chip (SoC). ISSCC 2026 will take place February 15–19, 2026 in San Francisco (Marriott...
« Older Entries
February 2026
M T W T F S S
« Nov    
 1
2345678
9101112131415
16171819202122
232425262728  

Address

Scientific Visual SA
Chemin du Closel 5
1020 Renens
Switzerland

Get in touch

+41 79 933 23 62
welcome@scientificvisual.ch

Our privacy policy

French correspondence address

℅ Mail Boxes Etc Centre MBE2535
Scientific Visual / Frédéric Falise
10 Rue de Versoix
01210 Ferney-Voltaire
France

Follow Us

Twitter