by Abeti Ilofo | Nov 6, 2025
We are proud to announce that the SiC Puck Scanner, co-authored by PVA TePla and Scientific Visual, is featured on the cover of Compound Semiconductor (Vol. 31, Issue VIII 2025) — one of the most respected publications in the semiconductor industry. The cover story,...
by Abeti Ilofo | Sep 10, 2025
Scientific Visual is pleased to announce that Frédéric Falise, Director and COO of the company, will speak at the upcoming International Conference on Silicon Carbide and Related Materials (ICSCRM 2025) in Busan. Mr. Falise will deliver an Industrial Talk on 15...
by Abeti Ilofo | Mar 5, 2025
We are excited to announce that Frédéric Falise, Executive Director at Scientific Visual, will be speaking at the CS International Conference 2025 in Brussels (7th – 9th April 2025). This year’s presentation will focus on “PVA Tepla...
by Abeti Ilofo | Feb 15, 2025
We’re sharing this workshop because its non-destructive X-ray/neutron and microscopy methods align with our readers’ interests in SiC defect mapping, early puck screening, and wafer-level reliability/yield. Link: workshops.ill.fr/event/544/ ...
by Abeti Ilofo | Feb 15, 2025
We are pleased to highlight our partner PVA TePla, who will be exhibiting at SEMICON Japan 2025, taking place from December 17–19 at Tokyo Big Sight. SEMICON Japan is one of the most important events in Asia for the semiconductor and electronics manufacturing...
