by Abeti Ilofo | Feb 26, 2026
25-Feb-2026 – Scientific Visual is pleased to announce a new collaboration focused on the inspection of titanium‑doped sapphire (Ti:sapphire), a laser crystal known for its demanding growth process. Scientific Visual’s sapphire scanners, already optimized for boules...
by Abeti Ilofo | Nov 6, 2025
We are proud to announce that the SiC Puck Scanner, co-authored by PVA TePla and Scientific Visual, is featured on the cover of Compound Semiconductor (Vol. 31, Issue VIII 2025) — one of the most respected publications in the semiconductor industry. The cover story,...
by Abeti Ilofo | Sep 10, 2025
Scientific Visual is pleased to announce that Frédéric Falise, Director and COO of the company, will speak at the upcoming International Conference on Silicon Carbide and Related Materials (ICSCRM 2025) in Busan. Mr. Falise will deliver an Industrial Talk on 15...
by Abeti Ilofo | Mar 5, 2025
We are excited to announce that Frédéric Falise, Executive Director at Scientific Visual, will be speaking at the CS International Conference 2025 in Brussels (7th – 9th April 2025). This year’s presentation will focus on “PVA Tepla...
by Abeti Ilofo | Feb 27, 2025
Join us at the 16th CS International conference from April 20–22, 2026, in Brussels, where Scientific Visual will attend and connect with industry leaders in crystal inspection and compound semiconductors. We will be available throughout the event to discuss how our...
