by webmaster | Nov 6, 2025
We are proud to announce that the SiC Puck Scanner, co-authored by PVA TePla and Scientific Visual, is featured on the cover of Compound Semiconductor (Vol. 31, Issue VIII 2025) — one of the most respected publications in the semiconductor industry. The cover story,...
by webmaster | Sep 10, 2025
Scientific Visual is pleased to announce that Frédéric Falise, COO and Executive Director of the company, will speak at the upcoming International Conference on Silicon Carbide and Related Materials (ICSCRM 2025) in Busan. Mr. Falise will deliver an Industrial Talk on...
by webmaster | Mar 5, 2025
We are excited to announce that Frédéric Falise, Executive Director at Scientific Visual, will be speaking at the CS International Conference 2025 in Brussels (7th – 9th April 2025). This year’s presentation will focus on “PVA Tepla...
by webmaster | Feb 27, 2025
Scientific Visual attended the 16th CS International conference, held April 20–22, 2026, in Brussels, connecting with industry leaders in crystal inspection and compound semiconductors. Throughout the event we discussed how our crystal inspection technologies help...
by webmaster | Jan 20, 2025
We are pleased to announce Scientific Visual strategic partnership with PVA TePla, a globally operating high-tech holding with expertise in semiconductors, crystal furnaces, and material inspection. This collaboration will further advance our capabilities in crystal...
