by webmaster | Apr 19, 2015
On April 10th 2015, Ivan Orlov, CEO of Scientific Visual SA presented at SEMICON China HB-LED Standards TC Spring Meeting 2015 in Nanjing, China. He presented a proposal for LED sapphire inspection standards: ‘Specification for Sapphire Single Crystal Ingot...
by webmaster | Mar 16, 2015
Let’s face this fact. While sapphire growth-sawing-wafering stages are quickly moving towards full automation, the defect quality inspection in produced ingots remains mostly human and very rudimentary. The establishment of industry-wide grading scale will bring two...
by webmaster | Jun 19, 2014
GENEVA, SWITZERLAND ― June 18, 2014. Ivan Orlov, CEO of Scientific Visual SA and Benedict Stalder, VP, presented a technical conference on identifying defects in synthetic sapphire at the EPHJ trade salon. The conference presented the results of quality...
by webmaster | May 17, 2014
Taking guess work out of sapphire production: from early stage defect detection to quality norms. Contrôle des défauts matière dans le saphir: de la détection automatique avant et après polissage à l’établissement d’une...
by webmaster | May 16, 2014
EPHJ-2014, Geneva, Switzerland. Scientific Visual will exhibit in Booth #R34: https://www.ephj.ch/. Scientific Visual conference on sapphire quality control will take place on June 18th, 10.30 am. Click here to see more details about the conference....
by webmaster | Jun 11, 2013
LAUSANNE, SWITZERLAND ― June 11, 2013. Scientific Visual today unveiled SapphiroScan™, the first automatic quality control tool detecting material defects in sapphire watch covers. This fully automated instrument scans non-polished watch covers 26-42 mm in...
