We’re sharing this workshop because its non-destructive X-ray/neutron and microscopy methods align with our readers’ interests in SiC defect mapping, early puck screening, and wafer-level reliability/yield.
Link: workshops.ill.fr/event/544/
We’re sharing this workshop because its non-destructive X-ray/neutron and microscopy methods align with our readers’ interests in SiC defect mapping, early puck screening, and wafer-level reliability/yield.
Link: workshops.ill.fr/event/544/