We are excited to announce that Frédéric Falise, Executive Director at Scientific Visual, will be speaking at the CS International Conference 2025 in Brussels (7 – 9 April 2025).
This year’s presentation will focus on “PVA Tepla Metrology Solutions for Compound Semiconductors”, highlighting our recent collaboration with PVA. Discover more about our joint efforts.
Join industry leaders and innovators from around the globe at CS International 2025 to explore the latest advancements and trends in semiconductor technology. Don’t miss this insightful session by one of the leading minds in metrology solutions!
If you are not yet registered, here is the link!
We are looking forward to meeting you there!