Scientific Visual is pleased to announce that Frédéric Falise, Director and COO of the company, will speak at the upcoming International Conference on Silicon Carbide and Related Materials (ICSCRM 2025) in Busan.
Mr. Falise will deliver an Industrial Talk on 15 September at 6:50 pm, presenting in depth the new inspection solution developed in collaboration with PVA TePla. This innovation represents a major advance in SiC quality control, offering non-destructive, full-volume defect mapping and automated material grading.
For further background, please refer to the article:
What does the SiC Puck Scanner reveal?