Discover Non-Destructive 3D Inspection for SiC Pucks — Live at ICSCRM 2025
Scientific Visual, incollaboration with its partner PVA TePla, will present a breakthrough in SiC quality control at booth #55 during ICSCRM 2025 in Busan (September 14-19).
Join us to explore cutting-edge solutions that enhance precision and performance for SiC crystal analysis and inspection. Don’t miss this chance to connect with our team and see our innovations firsthand!
The International Conference on Silicon Carbide and Related Materials (ICSCRM) is the most important technical conference series on silicon carbide (SiC) and related materials. Commencing in Washington D.C. in 1987, ICSCRM has evolved into a time-honored international academic gathering. It offers a yearly opportunity for the dissemination of cutting-edge research findings and engaging discussions in the realm of silicon carbide and related materials, facilitating the exchange of novel insights. The ICSCRM 2025 will take place in Korea, which stands as a stronghold in semiconductor manufacturing, with rapid advancements and growth in power semiconductor technologies, including silicon carbide.
Link: https://icscrm2025.org/