September 27 – October 2, 2026 – International Conference on Silicon Carbide and Related Materials (ICSCRM 2026) – Yokohama, Japan
ICSCRM is the world’s leading conference series on Silicon Carbide (SiC) and wide-bandgap semiconductors, bringing together researchers and industry across crystal growth, material characterization, and device manufacturing.
Scientific Visual attended the 23rd edition, where our representative presented how our optical inspection technology detects and classifies defects in SiC and other crystalline materials.
