AI your metrology

We help metrology teams craft the AI execution machinery

You have metrology data.
We have AI kit to turn it into decisions.

Scientific Visual helps metrology and R&D teams build their first AI‑based defect detection solution without hiring a full internal AI department.

Your tools already acquire valuable images and measurements. Scientific Visual provides the defect‑labelling software, model‑training expertise, and deployment support needed to turn this data into an assisted or fully automatic defect detection.

Our products – from YieldPro™ software to the SiC puck scanner – use AI‑driven defect analysis. Backed by 10+ years of delivering metrology to the semiconductor and industrial crystal industries, Scientific Visual combines domain expertise and practical AI tools to make your first defect detection project a success.

 

1. Defect labelling tools

For AI, good labels matter most.

Scientific Visual has spent more than ten years working in defect recognition and has developed proprietary software for fast, high‑quality annotation. Assisted labelling workflows guide trained operators through images, suggest regions of interest, and make it easy to create precise masks instead of drawing everything by hand.

Beyond speed, Scientific Visual focuses on label quality. Built‑in tools compare AI‑generated masks with trusted ground truth so that inconsistencies and missed defects are found early, before they contaminate the training set. Your team can perform labelling on its own using these tools, collaborate with Scientific Visual’s trained labellers, or outsource the entire dataset creation process; in every case, the goal is to reach production‑grade labels much faster than with generic tools.

2. Training your first AI model

Once a reliable labelled dataset exists, Scientific Visual trains AI models tailored to your process and defect types.

The service is flexible: you may prefer to stay hands‑off and receive a ready‑to‑use model, or want your engineers involved in reviews and acceptance criteria. Both ways are supported, with clear transparent performance metrics.

Two complementary modes of AI use exist.

In assisted defect detection, the AI highlights likely defects and suggests classifications while a human reviewer confirms or corrects the results. This is the recommended entry point for a first project because it builds confidence and provides continuous feedback to improve the model.

In automatic defect detection, validated models run without human review for routine production steps where stable, high‑confidence performance has been demonstrated. Moving from assisted to automatic is possible at a later stage.

3. Deployment

Scientific Visual supports deployment from first installation to stable day-to-day operation. We help you translate a validated model into a practical production configuration, aligned with your IT constraints, and manufacturing workflow.

To avoid surprises, we assist your team in installing and running the first configuration end-to-end: hardware sizing and computer requirements, environment setup, model packaging, performance checks, and a clear validation procedure so you can confirm results under your own conditions. If you have internal software developers, we provide guidance on maintaining the solution over time, including update strategies, versioning and rollback, and repeatable deployment practices.

Scientific Visual helps in the entire value chain — from ideation to running software and advising the computing infrastructure, and support management – by acting as the “co-intellect” collaborator assisting on the path we have already travelled.

Starting choice: Assisted or automatic defect detection?

Every project begins by choosing the right balance between human expertise and automation.

Scientific Visual helps define where assisted defect detection is most valuable—for example, early development, complex new products, or critical process steps—and where fully automatic detection can safely increase throughput and reduce operator load.

Our team recommends starting with assisted defect detection and expanding toward automation, mid‑size metrology and R&D organizations can adopt AI at their own pace.

Scientific Visual’s role is to provide the tools and expertise to make that first AI defect detection project successful, repeatable, and ready to grow.

Frequently Asked Questions

What exactly does “AI for metrology” mean?

It refers to the use of artificial intelligence (machine learning, usually asssited by computer vision or other imaging tools) to analyse signal data, patterns and defects, and support decision-making within manufacturing and R&D.

How does AI improve defect detection compared to traditional methods?

AI models can learn from historical defect examples and generalise to new data. It allows to bring more robust detection on complex, noisy, or variable backgrounds, where traditional rule-based algorithms struggle. 

What do I need to start an AI project with Scientific Visual?

A representative set of your metrology images or measurement outputs (labelled or not).  Scientific Visual will provide tools and support for generating and validating labels, and the following steps. 

Do I need a large dataset to train the AI?

More data can improve model performance and generalisation, but our workflows are designed to get you started even with moderate datasets. Contact our team to discuss the data you have, and we will help to choose further strategy.

Can the AI run fully automatically in production?

Yes. After initial validation and benchmarking, models can be deployed for fully automatic defect detection. Alternatively, you may start with an assisted mode where AI suggestions are reviewed by a human operator.

How is data privacy handled? We can't disclose our data to external companies.

Your data stays fully under your control. When required, Scientific Visual’s AI solutions can run entirely on-premise, with no requirement to share data to us. Models are trained exclusively by your personnel, on your data and remain your intellectual property. No customer data is required to be disclosed. 

What types of companies are best suited for your service?

Our solutions are best for small and medium-sized enterprises (SMEs) operating in high-tech industries, especially with a focus on semiconductor metrology and advanced materials inspection.

Is training or support included?

Yes. Onboarding, training, and ongoing support are included. If needed, we can also provide trained labellers to accelerate data preparation.