Scientific Visual CEO Dr. Ivan Orlov will present a keynote at SEMICON China 2020, one of the largest and the most comprehensive annual semiconductor technology conferences since 2000.

The lecture entitled “Quality Control in sapphire growing: From automated defect detection to big data approach” will cover recent advances in early-stage crystal inspection and application of statistical data obtained by it.

Due to COVID situation the conference is taking place online. The keynote is available online on the conference website from 26 June 2020. 

The main focus of SEMICON China is the further development of China semiconductor and related emerging industries. High-level executives from the industry, science, and government will present their view and showcase their latest products and technology in the premier stage.

 

 

 

 

 

 

 

 

 

Semicon China https://www.semiconchina.org/