Scientific Visual CEO Dr. Ivan Orlov will present keynote at SEMICON China 2020, one of the largest and the most comprehensive annual semiconductor technology conferences since 2000.
The lecture entitled “Quality Control in sapphire growing: From automated defect detection to big data approach” will cover recent advances in early-stage crystal inspection and application of statistical data obtained by it.
15 March 2020 at 11:25, meeting room 3B.
The main focus of SEMICON China is the further development of the China semiconductor and related emerging industries. High level executives from the industry, science and government will present their view and showcase their latest products and technology in the premier stage.
Semicon China http://www.semiconchina.org/