by Ivan Orlov | Oct 26, 2026
The IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Symposium (NSS MIC RTSD) is the leading international meeting on radiation detectors, detector materials, and imaging instrumentation. Scientific Visual will...
by Ivan Orlov | Oct 26, 2026
SEMICON Japan is one of Asia’s leading exhibitions for the semiconductor manufacturing supply chain, connecting companies across materials, equipment, and manufacturing. Scientific Visual will attend SEMICON Japan 2026 at Tokyo Big Sight — meet our representative to...
by Ivan Orlov | Oct 13, 2026
13 October 2026 – Scientific Visual welcomed a delegation from Shanghai Zhangjiang (Group) Co., Ltd. and the Shanghai Optoelectronics Science and Technology Innovation Center (OEINO). The discussions focused on cooperation in crystal inspection and on how Scientific...
by Ivan Orlov | Mar 24, 2026
23-March-2026 – We were honoured to welcome Minister Huai Jinpeng and his delegation to Scientific Visual this week. Our team presented how early-stage 3D inspection improves crystal processing yield for next-generation electronics, photonics, and advanced materials....
by Ivan Orlov | Sep 7, 2022
Scientific Visual is proud to present a case study on the impact of sapphire material defects on LED wafering. An automated crystal scanner recorded defects in sapphire boules as they passed through consecutive production steps: raw crystals (boules) ➜ cores ➜...
