by webmaster | Sep 25, 2016
SHENZHEN, GUANGDONG, CHINA ― 7 September 2016. Dr. Ivan Orlov, CEO of Scientific Visual SA, Switzerland, presented lecture titled ”Taking guesswork out of sapphire production: from defect detection to better yield” at CIEO exhibition...
by webmaster | Jun 8, 2016
从检查缺陷去提升良率, 不再在生产蓝宝石的时候猜测了 为了减少晶体的缺陷和提高产量，典型的生产团队必需要做出很多的推测去优化长晶的工艺。 虽然缺陷本身带着可供参考的资料，可是在目前的检查方法之下, 大部分的资料只能在取棒、切、磨、抛以迄完成品之后才被发现，实在是为时已晚。 我們將向你报告如何利用自动化的缺陷检测设备，去缩短反馈的过程，並迖至提高良率。 报告将演示： 客观地检查(也可以作个别的观察)晶砣和晶棒中缺陷的大小和形态。 从质量控制自动化之中，我们可以得到哪些资料？...
by webmaster | Oct 27, 2015
Dear customers and dear suppliers, We inform you that our company will be closed from December 23th till January 2nd . The work will start again on January 3rd, 2017. Best regards, Scientific Visual team
by webmaster | Jul 7, 2015
Despite flaws being an intrinsic problem in sapphire manufacture, there are currently no international quality standards in existence to quantify the level of yield-impacting defects. This creates uncertainty for end-users who can never be sure of the quality of...
by webmaster | Jun 11, 2015
EPHJ-2014, Geneva, Switzerland. Scientific Visual will exhibit in Booth #R34: https://www.ephj.ch/. Scientific Visual conference on sapphire quality control will take place on June 18th, 10.30 am. Click here to see more details about the conference.
