by Ivan Orlov | Mar 24, 2026
23-March-2026 – We were honoured to welcome Minister Huai Jinpeng and his delegation to Scientific Visual this week. Our team presented how early-stage 3D inspection improves crystal processing yield for next-generation electronics, photonics, and advanced materials....
by webmaster | Feb 26, 2026
25-Feb-2026 – Scientific Visual is pleased to announce a new collaboration focused on the inspection of titanium‑doped sapphire (Ti:sapphire), a laser crystal known for its demanding growth process. Scientific Visual’s sapphire scanners, already optimized for boules...
by webmaster | Feb 25, 2026
Scientific Visual’s Lead Scientist Dr Caroline Chèze will speak at the German Crystal Growth Conference (DKT 2026) held in in Karlsruhe, Germany 4-6 March 2026. On Wednesday 4 March, Dr Cheze will present in Session 1, “Growth methods for optical crystals,” at...
by webmaster | Nov 6, 2025
We are proud to announce that the SiC Puck Scanner, co-authored by PVA TePla and Scientific Visual, is featured on the cover of Compound Semiconductor (Vol. 31, Issue VIII 2025) — one of the most respected publications in the semiconductor industry. The cover story,...
by webmaster | Sep 10, 2025
Scientific Visual is pleased to announce that Frédéric Falise, Director and COO of the company, will speak at the upcoming International Conference on Silicon Carbide and Related Materials (ICSCRM 2025) in Busan. Mr. Falise will deliver an Industrial Talk on 15...
by webmaster | Mar 5, 2025
We are excited to announce that Frédéric Falise, Executive Director at Scientific Visual, will be speaking at the CS International Conference 2025 in Brussels (7th – 9th April 2025). This year’s presentation will focus on “PVA Tepla...
