by webmaster | Jul 26, 2026
22-24 July 2026 – Scientific Visual participated in the EIC Corporate Day, where our CEO Ivan Orlov presented the company inspection technology and discussed collaboration opportunities with Asian industrial partners. The EIC Corporate Day is part of the European...
by Ivan Orlov | Mar 24, 2026
23-March-2026 – We were honoured to welcome Minister Huai Jinpeng and his delegation to Scientific Visual this week. Our team presented how early-stage 3D inspection improves crystal processing yield for next-generation electronics, photonics, and advanced materials....
by webmaster | Feb 26, 2026
25-Feb-2026 – Scientific Visual is pleased to announce a new collaboration focused on the inspection of titanium‑doped sapphire (Ti:sapphire), a laser crystal known for its demanding growth process. Scientific Visual’s sapphire scanners, already optimized for boules...
by webmaster | Sep 7, 2021
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by webmaster | Mar 16, 2021
Scientific Visual CEO Dr. Ivan Orlov presented a keynote at the China Semiconductor Technology International Conference (CSTIC) , one of the largest and the most comprehensive annual semiconductor technology conferences since 2000 during SEMICON China 2021.The lecture...
by Ivan Orlov | Oct 23, 2020
The international workshop “Silicon Carbide in Europe 2020” (SiCE-2020) will be held on November 19, 2020, as a satellite event of the AEIT2020 virtual conference....
