Scientific Visual CEO Dr. Ivan Orlov will present a lecture at the China Semiconductor Technology International Conference (CSTIC), one of the largest and the most comprehensive annual semiconductor technology conferences since 2000 during SEMICON China 2022.
The lecture is entitled “Digital Defect Traceability across Sapphire Processing: Case Study on Micro-LED Chain“. It will present the results of a research performed by four major market players on the impact of sapphire defects on the micro-LED wafer quality. This study is part of a larger sapphire characterisation project, whose goal is to trace yield-impacting defects and establish end-to-end digital quality control in crystal production.
The main focus of SEMICON China is the further development of China semiconductor and related emerging industries. High-level executives from the industry, science, and government present their view and showcase their latest products and technology in the premier stage.