by webmaster | Jul 7, 2015
Despite flaws being an intrinsic problem in sapphire manufacture, there are currently no international quality standards in existence to quantify the level of yield-impacting defects. This creates uncertainty for end-users who can never be sure of the quality of...
by webmaster | May 30, 2015
LAUSANNE, SWITZERLAND ― 27 November 2015. Scientific Visual, the Lausanne-based hi-tech company has been awarded the prestigious Prix Alliance de l’innovation 2015. The award marks the 10th anniversary of Alliance Association’s activities in Switzerland. Scientific...
by webmaster | Apr 19, 2015
On April 10th 2015, Ivan Orlov, CEO of Scientific Visual SA presented at SEMICON China HB-LED Standards TC Spring Meeting 2015 in Nanjing, China. He presented a proposal for LED sapphire inspection standards: ‘Specification for Sapphire Single Crystal Ingot...
by webmaster | Mar 16, 2015
Let’s face this fact. While sapphire growth-sawing-wafering stages are quickly moving towards full automation, the defect quality inspection in produced ingots remains mostly human and very rudimentary. The establishment of industry-wide grading scale will bring two...
by webmaster | Jun 19, 2014
GENEVA, SWITZERLAND ― June 18, 2014. Ivan Orlov, CEO of Scientific Visual SA and Benedict Stalder, VP, presented a technical conference on identifying defects in synthetic sapphire at the EPHJ trade salon. The conference presented the results of quality...
by webmaster | May 17, 2014
Taking guess work out of sapphire production: from early stage defect detection to quality norms. Contrôle des défauts matière dans le saphir: de la détection automatique avant et après polissage à l’établissement d’une...
