SapphiroScope™

Defect detection in sapphire ingots for LED and optics

Overview

 

SapphiroScope™ automated workstation inspects and assesses the quality of raw ingots (cylinders or rectangular bricks) before processing into wafer substrates for LED or into optical components.

SapphiroScope™ provides a 3D view of internal material defects without the need for polishing or ‘opening a window’. It allows the operator to sort incoming material, optimise it for the most efficient processing method, and predict wafering yield.

What it provides

    1. Automated mapping of bubbles, structures, and clouds prior to wafering
    2. Measurement and classification of defects, including XYZ position, size, morphology
    3. Good/bad wafers indication
    4. Analysis in polarised light to detect twins, lattice defects and LABs
    5. 3D model of defects to share with your customers and suppliers.

A 3D model visualises the defects in the sapphire cylinder or a pre-form. The user has the possibility to rotate the 3D model, scan through the core volume, zoom, visualise and measure separate defects, and indicate defective wafers.

This three-minute video demonstrates handling of a non-polished sapphire core: rotation, zoom, defect identification and wafering by an operator.

Click at the right bottom corner to open the video in full size.

What is inspected?

Materials:

    1. Sapphire
    2. Ruby
    3. Transparent ceramics
    4. LTO, LTN
    5. Quartz
    6. Laser crystals
    7. Borosilicate glass

Dimensions:

    • Cylinder ingots and rectangular bricks
    • 2”, 4”, 6”, 8” or customized

Key benefits

    1. Automated quality inspection improves the yield of useable material
    2. Early defect detection ensures only the best material enters the costly processing chain
    3. Fast and objective feedback to the production team
    4. Measure the influence of growth parameters on production quality
    5. Objective, standardized and repeatable grading of your products improves customer relations.

Get a quote